• Automated sheet resistivity measurement systems for laboratory, research, and small productions.
• Measures V/I, Sheet Resistance, Resistivity or Thickness Reports Average, Standard Deviation, Minimum, Maximum and

1Sigma for the data set Temperature Coefficient of Resistance (TCR) measurements integrated with automated temperature chuck and source meter (Optional), Automated 2D Color Contour mapping, 3D and Cross section mapping employs the Dual Configuration Testing method for improved accuracy and repeatability, tests samples 10mm to 300mm, P/N Typing, Comparative Mapping.