Accurate and Reliable DC-CV/IV Analytical Probing

DC- CV/IV Analytical Probing

WL-250

200MM SEMI-AUTOMATIC PROBE STATIONS

200MM SEMI-AUTOMATIC PROBE STATIONS FOR RELIABLE, ACCURATE RF/DC/CV AND HIGH-POWER TEST MEASUREMENTS

WL-210-LE

WL-210-LE MANUAL PROBE SYSTEM WITH LOCAL ENCLOSURE

WL-210-LE PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER THERMAL TEST MEASUREMENTS

H-150

Economic Manual Prober

H-150 5mm-100mm Manual Probe System Economically Designed for reliable and Accurate Analytical Testing of DC, CV-IV Applications

S-750

Economic 3 Axis Micropositioner

ECONOMIC MICROPOSITIONER WITH 3-AXIS CONTROL MOVEMENT, JOYSTICK X-Y MOVEMENT & "Z" KNOB. DESIGNED FOR PAD PROBING

S-CBP

LOW LEAKAGE CERAMIC BLADE, HIGH TEMP, COAX PROBE

CERAMIC ISOLATED <25fA COAX PROBE & HOLDER

WL-350-LE

300MM SEMI-AUTOMATIC PROBE SYSTEM WITH LOCAL ENCLOSURE

300mm Semi-Automatic probe station for reliable and accurate RF/DC/CV/High Power, thermal test measurements.

WL-250-LE

200MM SEMI-AUTOMATIC RF-DC PROBE SYSTEM WITH LOCAL ENCLOSURE

200MM Semi-Automatic Probe Station For Reliable, Accurate RF/DC/CV/& High Power Thermal Test Measurements.

CM-350

CHECKMATE 300MM SEMI-AUTOMATIC PROBE STATION

FOR RELIABLE, ACCURATE RF/DC/CV,AND HIGH-POWER ON WAFER TEST MEASUREMENTS

CM-460

CHECKMATE 150MM SEMI-AUTOMATIC PROBE STATION

FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS

CAP-946

COMPUTER AIDED PROBE SUM-MICRON MICROPOSITIONER

CONTROLLED BY SOFTWARE AND/OR BY JOYSTICK - THUMB WHEELS, BUILT-IN MICRO-MOTORS - SPECIFICALLY DESIGNED FOR SUB-MICRON PROBING

A-ZOOM MICRO

HIGH POWER MONO ZOOM VIDEO SCOPE

LOW TO HIGH MAG 1X-7X ZOOMING SCOPE WITH LONG WORKING DISTANCE CAMERA PORT AND OPTIONAL EYEPIECES

S-S12Z

HIGH POWER MONO ZOOM VIDEO SCOPE

LOW TO HIGH MAG 1X-12X ZOOMING SCOPE WITH LONG WORKING DISTANCE AND CAMERA PORT

CM-BMC-VC

Board Mount Vice Chuck

Board Mount Vice Chuck For Holding Individual Chips, Devices, Boards...

WL-310-LE

300MM MANUAL RF-DC PROBE SYSTEM WITH LOCAL ENCLOSURE

300mm manual probe station for reliable and accurate RF/DC/CV/High Power , thermal test measurements.

CM-250

CHECKMATE 200MM SEMI-AUTOMATIC PROBE STATION

FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS

WL-170-THZ

WL-170-THZ STABLE MANUAL RF-mmW PROBE STATION

Designed for reliable and accurate test of mmW, THz, and impedance tuner applications.

WL-170

WL-170 HIGH STABILITY MANUAL RF PROBE STATION

WL-170 PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER TEST MEASUREMENTS

WL-1160

WL-1160 MULTI-PURPOSE MANUAL RF PROBE STATION

Economical - reliable and accurate test measurements of RF/DC/CV/High Power, MEMS,...devices.

CM-210

CHECKMATE 200MM HIGH PRECISION MANUAL PROBE STATION

FOR RELIABLE AND ACCURATE DC, CV/IV, HIGH POWER & RF TEST MEASUREMENTS

CM-170

CHECKMATE HIGH STABILITY MANUAL ANALYTICAL PROBE STATION

FOR RELIABLE,-ACCURATE "CV /IV, DC & HIGH POWER MEASUREMENT ANALYSIS

S-1160

MULTI-PURPOSE MANUAL PROBE STATION

100MM, 150MM,200MM MANUAL PROBE SYSTEM DESIGNED FOR RELIABLE AND ACCURATE ANALYTICAL TESTING OF DC, CV-IV, AND HIGH-POWER APPLICATIONS

SP-150

HIGH PRECISION IN-LINE X-Y-Z MICROPOSITIONER

High-precision micropositioner with inline control knobs, The SP-150 allows for easy probing on pads as well as internal lines with sub-micron accuracy.

SP-100

ULTRA STABLE X-Y-Z 100TPI IN-LINE MICROPOSITIONER

Ultra-Stable micropositioner with inline control knobs, The SP-100 allows for easy probing on pads as well as internal lines with sub-micron accuracy.

S-926

PRECISISION X-Y-Z 100TPI MICROPOSITIONER

STABLE 3-AXIS LEANEAR DIRECTION CONTROL MICROPOSITIONER WITH INDEPENDANT CONTROL KNOBS, .

S-725

X-Y-Z ECONOMIC MICROPOSITIONER

X-Y-Z ECONOMIC MICROPOSITIONER WITH 3 CONTROLS KNOBS, THE S-725 WILL ALLOW EASY LANDING ON PADS AND INTERNAL MICRON LINES .

U-S

PROBE HOLDER WITH SCREW-LOCK PROBE TIP CONNECTION

Universal series probe tip holder comes in one universal length of 4.75". This holder is made to be bent or cut to length by the customer.

U-P

PROBE HOLDER WITH SPRING-CLIP PROBE TIP CONNECTION

Universal probe tip holder comes in one length of 4.75". This holder is made to be bent or cut by the customer.

USCB

PROBE HOLDERS/ DELRIN ISOLATED COAX

Low leakage- Delrin isolated, 10pA coaxial probe tip holder with Screw Lock.

USTB

PROBE HOLDERS/ TEFLON ISOLATED COAX

Low leakage, Teflon isolated, 1pA coaxial probe tip holder with Screw Lock.

USGB

PROBE HOLDERS/ CERAMIC ISOLATED COAX

Low leakage, Ceramic isolate, high temperature, coaxial probe tip holder with Screw Lock.

UPCB

PROBE HOLDERS/ DELRIN ISOLATED COAX

Low leakage, delrin isolated, 10pA probe holder with Spring Clip.

UPTB

PROBE HOLDERS/ TEFLON ISOLATED COAX

Low leakage, Teflon isolated 1pA coaxial probe tip holder with Spring Clip.

UPGB

PROBE HOLDERS/ CERAMIC ISOLATED COAX

Low Leakage ceramic isolated, high temperature, coaxial probe holder with Spring Clip.

TRX-L-60-#

PROBE HOLDERS/ TRIAXIAL ISOLATION

Very low-leakage, isolated 2fA triaxial probe holder with Screw Lock.

SCA-50

HIGH ISOLATED COAX PROBE HOLDERS

LOW LEAKAGE ISOLATED <10fA COAX PROBE & HOLDER

SCA-250

HIGH ISOLATED KELVIN COAX PROBE & HOLDERS

DOUBLE TIP AVAILABLE FROM 5µ TO 12.5µ WITH SPACING OF 12.5µ TO 100µ

SE-T

5µ, TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-TB

25µ TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 25µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-TC

TUNGSTEN CARBIDE PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE TUNGSTEN CARBIDE CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.

SE-TG

GOLD PLATED TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE GOLD PLATED TUNGSTEN CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATION.

SE-TL

TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONG LENGTH SHAFT OF 50.1MM, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-TZ

Z-SHAPE TUNGSTEN PROBE TIPS

Z-SHAPE TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-20T

3.5µ TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-20TB

20µ TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-20TBL

20µ, TUNGSTEN (LONG) PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONGER LENGTH (51mm), THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR LOW PROFILE SETUPS

SE-20TZ

Z-SHAPE TUNGSTEN PROBE TIPS

Z-SHAPE TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-20BC

BERYLLIUM COPPER PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATION.

SE-20BCB

BERYLLIUM COPPER PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 125µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.

DC- CV/IV Analytical Probing

Applications

Products

Signatone

Request a Quote