High Power Characterization Archives

High Power Characterization

HVP-CX-3

HIGH VOLTAGE 3KV COAX PROBE HOLDER

High Voltage 3KV coax probe holder with Needle-Vice tip mount and cable

HPV-CX-10

HIGH VOLTAGE 10KV COAX PROBE HOLDER

High Voltage 10KV coax probe holder with Needle-Vice tip mount and cable.

HPV-TX-3

HIGH VOLTAGE 3KV TRIAX PROBE HOLDER

High Voltage 3KV Triax probe holder with Needle-Vice tip mount and cable.

WL-250

200MM SEMI-AUTOMATIC PROBE STATIONS

200MM SEMI-AUTOMATIC PROBE STATIONS FOR RELIABLE, ACCURATE RF/DC/CV AND HIGH-POWER TEST MEASUREMENTS

WL-210-LE

WL-210-LE MANUAL PROBE SYSTEM WITH LOCAL ENCLOSURE

WL-210-LE PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER THERMAL TEST MEASUREMENTS

WL-350-LE

300MM SEMI-AUTOMATIC PROBE SYSTEM WITH LOCAL ENCLOSURE

300mm Semi-Automatic probe station for reliable and accurate RF/DC/CV/High Power, thermal test measurements.

WL-250-LE

200MM SEMI-AUTOMATIC RF-DC PROBE SYSTEM WITH LOCAL ENCLOSURE

200MM Semi-Automatic Probe Station For Reliable, Accurate RF/DC/CV/& High Power Thermal Test Measurements.

CM-350

CHECKMATE 300MM SEMI-AUTOMATIC PROBE STATION

FOR RELIABLE, ACCURATE RF/DC/CV,AND HIGH-POWER ON WAFER TEST MEASUREMENTS

CM-460

CHECKMATE 150MM SEMI-AUTOMATIC PROBE STATION

FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS

S-S12Z

HIGH POWER MONO ZOOM VIDEO SCOPE

LOW TO HIGH MAG 1X-12X ZOOMING SCOPE WITH LONG WORKING DISTANCE AND CAMERA PORT

WL-310-LE

300MM MANUAL RF-DC PROBE SYSTEM WITH LOCAL ENCLOSURE

300mm manual probe station for reliable and accurate RF/DC/CV/High Power , thermal test measurements.

CM-250

CHECKMATE 200MM SEMI-AUTOMATIC PROBE STATION

FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS

WL-170

WL-170 HIGH STABILITY MANUAL RF PROBE STATION

WL-170 PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER TEST MEASUREMENTS

CM-210

CHECKMATE 200MM HIGH PRECISION MANUAL PROBE STATION

FOR RELIABLE AND ACCURATE DC, CV/IV, HIGH POWER & RF TEST MEASUREMENTS

CM-170

CHECKMATE HIGH STABILITY MANUAL ANALYTICAL PROBE STATION

FOR RELIABLE,-ACCURATE "CV /IV, DC & HIGH POWER MEASUREMENT ANALYSIS

S-1160

MULTI-PURPOSE MANUAL PROBE STATION

100MM, 150MM,200MM MANUAL PROBE SYSTEM DESIGNED FOR RELIABLE AND ACCURATE ANALYTICAL TESTING OF DC, CV-IV, AND HIGH-POWER APPLICATIONS

SP-150

HIGH PRECISION IN-LINE X-Y-Z MICROPOSITIONER

High-precision micropositioner with inline control knobs, The SP-150 allows for easy probing on pads as well as internal lines with sub-micron accuracy.

SP-100

ULTRA STABLE X-Y-Z 100TPI IN-LINE MICROPOSITIONER

Ultra-Stable micropositioner with inline control knobs, The SP-100 allows for easy probing on pads as well as internal lines with sub-micron accuracy.

SE-T

5µ, TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-TB

25µ TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 25µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-TC

TUNGSTEN CARBIDE PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE TUNGSTEN CARBIDE CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.

SE-TG

GOLD PLATED TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE GOLD PLATED TUNGSTEN CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATION.

SE-20TB

20µ TUNGSTEN PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

SE-20TBL

20µ, TUNGSTEN (LONG) PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONGER LENGTH (51mm), THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR LOW PROFILE SETUPS

SE-20BC

BERYLLIUM COPPER PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATION.

SE-20BCB

BERYLLIUM COPPER PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 125µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.

SE-O

OSMIUM PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE OSMIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.

SE-P

PALLADIUM PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE PALLADIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER AND LOW LEAKAGE APPLICATIONS.

SE-S

STEEL PROBE TIPS

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE STEEL CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.

MT

HIGH POWER MICROSCOPE

HIGH POWER MICROSCOPE WITH 4 OBJECTIVE TURRIT, CAMERA MOUNT, AND FIBER OPTIC ILLUMINATION

SMZ-171

STEREO ZOOM LOW POWERED MICROSCOPE

STEREOZOOM SCOPE WITH 6.7:1 ZOOM, LED ILLUMINATION, EYEPIECES, TRINOCULAR HEAD, CAMERA PORT WITH LONG WORKING DISTANCE

High Power Characterization

Applications

Products

Signatone

Request a Quote