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Accessories For Test Stations
Alternative and Device Chucks
Microscope and Optical Systems
Probe Card Adapters
Thermal Chucks and Controllers
Vacuum Pumps and Compressors
Vibration Isolation Tables
Alternative and Device Chucks
Microscope and Optical Systems
Probe Card Adapters
Thermal Chucks and Controllers
Vacuum Pumps and Compressors
Vibration Isolation Tables
Resistivity Test Systems
4-Point Probe Measuring Heads
Manual Measurement Systems
Software Assisted Measurement Systems
TCR Temperature Coefficient of Resistivity
4-Point Probe Measuring Heads
Manual Measurement Systems
Software Assisted Measurement Systems
TCR Temperature Coefficient of Resistivity
Probe Stations
HF-RF and Millimeter Wave Stations
High Power Stations
Manual-Stations
Semi- Automated Measurement Systems
Semi-Automatic Stations
Thermal Controlled Stations
HF-RF and Millimeter Wave Stations
High Power Stations
Manual-Stations
Semi- Automated Measurement Systems
Semi-Automatic Stations
Thermal Controlled Stations
Probe Tips & Holders
Coax and Kelvin Probe Arms & Tips
DC – Passive Probes
Four Point Probe Heads
HF-RF- Millimeter Wave Probes
High Voltage High Power Probe Arms
Coax and Kelvin Probe Arms & Tips
DC – Passive Probes
Four Point Probe Heads
HF-RF- Millimeter Wave Probes
High Voltage High Power Probe Arms
Micropositioners
Computer Aided Positioner
Economical – Large Geometry Positioner
HF-RF Positioner
Manual High Precision Positioner
Millimeter Wave / Frequency Extender Positioner
Computer Aided Positioner
Economical – Large Geometry Positioner
HF-RF Positioner
Manual High Precision Positioner
Millimeter Wave / Frequency Extender Positioner
Resistivity Testing
4-Point Measurements
Manual Resistivity Testing
Semi-Automatic Resistivity Test Systems
Thermal Coefficient of Resistance (TCR) Testing
4-Point Measurements
Manual Resistivity Testing
Semi-Automatic Resistivity Test Systems
Thermal Coefficient of Resistance (TCR) Testing
RF - Microwave Test Solutions
DC To THz Probe Head Selection
Frequency Extenders and Tuners
HF & RF Microwave Probing
Millimeter Wave Probing
DC To THz Probe Head Selection
Frequency Extenders and Tuners
HF & RF Microwave Probing
Millimeter Wave Probing
DC- CV/IV Analytical Probing
CV/IV Measurements & Failure Analysis
MEMS Probing
Low Current Analysis
Manual Analytical Probing
Thermal Characterization
Automated Probing
CV/IV Measurements & Failure Analysis
MEMS Probing
Low Current Analysis
Manual Analytical Probing
Thermal Characterization
Automated Probing
High Power Characterization
High Voltage Probe Arms
Measurements
Probe Stations
Safety Modules
High Voltage Probe Arms
Measurements
Probe Stations
Safety Modules
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Manual Analytical Probing
WL-210-LE
WL-210-LE MANUAL PROBE SYSTEM WITH LOCAL ENCLOSURE
Wl-210-le probe stations for reliable,-accurate rf/dc/cv,and high-power thermal test measurements.
H-150
Economic Manual Prober
H-150 5mm-100mm manual probe system economically designed for reliable and accurate analytical testing of dc, cv-iv applications.
S-750
Economic 3 Axis Micropositioner
Economic micropositioner with 3-axis control movement, joystick x-y movement & "z" knob. Designed for pad probing.
S-CBP
LOW LEAKAGE CERAMIC BLADE, HIGH TEMP, COAX PROBE
Ceramic isolated <25fa coax probe & holder.
A-ZOOM MICRO
HIGH POWER MONO ZOOM VIDEO SCOPE
Low to high mag 1x-7x zooming scope with long working distance camera port and optional eyepieces.
S-S12Z
HIGH POWER MONO ZOOM VIDEO SCOPE
Low to high mag 1x-12x zooming scope with long working distance and camera port.
CM-BMC-VC
Board Mount Vice Chuck
Board mount vice chuck for holding individual chips, devices, boards...
CM-210
CHECKMATE 200MM HIGH PRECISION MANUAL PROBE STATION
For reliable and accurate dc, cv/iv, high power & rf test measurements.
CM-170
CHECKMATE HIGH STABILITY MANUAL ANALYTICAL PROBE STATION
For reliable,-accurate "cv /iv, dc & high power measurement analysis.
S-1160
MULTI-PURPOSE MANUAL PROBE STATION
100mm, 150mm,200mm manual probe system designed for reliable and accurate analytical testing of dc, cv-iv, and high-power applications.
SP-150
HIGH PRECISION IN-LINE X-Y-Z MICROPOSITIONER
High-precision micropositioner with inline control knobs, the sp-150 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
SP-100
ULTRA STABLE X-Y-Z 100TPI IN-LINE MICROPOSITIONER
Ultra-stable micropositioner with inline control knobs, the sp-100 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
S-926
PRECISISION X-Y-Z 100TPI MICROPOSITIONER
Stable 3-axis leanear direction control micropositioner with independant control knobs, .
S-725
X-Y-Z ECONOMIC MICROPOSITIONER
X-y-z economic micropositioner with 3 controls knobs, the s-725 will allow easy landing on pads and internal micron lines .
U-S
PROBE HOLDER WITH SCREW-LOCK PROBE TIP CONNECTION
Universal series probe tip holder comes in one universal length of 4.75". This holder is made to be bent or cut to length by the customer.
U-P
PROBE HOLDER WITH SPRING-CLIP PROBE TIP CONNECTION
Universal probe tip holder comes in one length of 4.75". This holder is made to be bent or cut by the customer.
USTB
PROBE HOLDERS/ TEFLON ISOLATED COAX
Low leakage, teflon isolated, 1pa coaxial probe tip holder with screw lock.
USGB
PROBE HOLDERS/ CERAMIC ISOLATED COAX
Low leakage, ceramic isolate, high temperature, coaxial probe tip holder with screw lock.
UPCB
PROBE HOLDERS/ DELRIN ISOLATED COAX
Low leakage, delrin isolated, 10pa probe holder with spring clip.
UPTB
PROBE HOLDERS/ TEFLON ISOLATED COAX
Low leakage, teflon isolated 1pa coaxial probe tip holder with spring clip.
UPGB
PROBE HOLDERS/ CERAMIC ISOLATED COAX
Low leakage ceramic isolated, high temperature, coaxial probe holder with spring clip.
TRX-L-60-#
PROBE HOLDERS/ TRIAXIAL ISOLATION
Very low-leakage, isolated 2fa triaxial probe holder with screw lock.
SE-T
5µ, TUNGSTEN PROBE TIPS
Straight test tip with tip diameter of 5µ, the rigid tungsten body can be bent and / or cut for use with small working distance objectives.
SE-TC
TUNGSTEN CARBIDE PROBE TIPS
Straight test tip with tip diameter of 12µ, the tungsten carbide can be bent and / or cut - for high power and hard material probing application.
SE-10T
1µ TUNGSTEN PROBE TIPS
Straight test tip with tip diameter of 1µ, the rigid tungsten body can be bent and / or cut for use with small working distance objectives.
MT
HIGH POWER MICROSCOPE
High power microscope with 4 objective turrit, camera mount, and fiber optic illumination.
SMZ-171
STEREO ZOOM LOW POWERED MICROSCOPE
Stereozoom scope with 6.7:1 zoom, led illumination, eyepieces, trinocular head, camera port with long working distance.
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