COMPUTER AIDED PROBE SUM-MICRON MICROPOSITIONER

CAP-946
DescriptionDocumentsTechnical SpecificationsRelated Products
COMPUTER AIDED PROBE
Part Number
CAP-946
Title
COMPUTER AIDED PROBE SUM-MICRON MICROPOSITIONER
Applications
Automated Probing
Low Current Analysis
MEMS Probing
Thermal Characterization
Description

CONTROLLED BY COMPUTER AND/OR BY JOYSTICK - THUMB WHEELS, THE CAP PROBES HAVE BUILT-IN MICRO-MOTORS AND ARE SPECIFICALLY DESIGNED FOR THE CHECKMATE SERIES OF SUB-MICRONIC PROBE STATIONS.

  • DIRECT PLUG IN TO ANY MODEL OF THE CHECKMATE SERIES (1-4 )
  • ALLOWS AUTOMATIC "HANDS-OFF" TEST SUB-ROUTINES INSIDE A DIE OR WHEN A PROBECARD IS USED TO POLARIZE THE DEVICE IN VIEW OF TESTING ITS INTERNAL NODES
  • AVAILABLE IN RF VERSION
Technical Specifications
ACCURACY
>1 MICRON
X-AXIS MOTION
25 mm
Y-AXIS MOTION
22 mm
Z-AXIS MOTION
12.5 mm
RESOLUTION
0.1 Micron
CONTROL
SOFTWARE, JOY STICK, THUMBWHEELS
MOUNTING BASE STYLE
MAGNETIC OR BOLT DOWN
HEAD STYLE
PIVOT HEAD OR THREE HOLE RF/HC/MT/4PP MOUNT