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    CV/IV Measurements & Failure Analysis
    WL-310-LE
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    300MM MANUAL RF-DC PROBE SYSTEM WITH LOCAL ENCLOSURE
    300mm manual probe station for reliable and accurate RF/DC/CV/High Power , thermal test measurements.
    CM-250
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    CHECKMATE 200MM SEMI-AUTOMATIC PROBE STATION
    FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS
    WL-170-THZ
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    WL-170-THZ STABLE MANUAL RF-mmW PROBE STATION
    Designed for reliable and accurate test of mmW, THz, and impedance tuner applications.
    WL-170
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    WL-170 HIGH STABILITY MANUAL RF PROBE STATION
    WL-170 PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER TEST MEASUREMENTS
    WL-1160
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    WL-1160 MULTI-PURPOSE MANUAL RF PROBE STATION
    Economical - reliable and accurate test measurements of RF/DC/CV/High Power, MEMS,...devices.
    CM-210
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    CHECKMATE 200MM HIGH PRECISION MANUAL PROBE STATION
    FOR RELIABLE AND ACCURATE DC, CV/IV, HIGH POWER & RF TEST MEASUREMENTS
    CM-170
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    CHECKMATE HIGH STABILITY MANUAL ANALYTICAL PROBE STATION
    FOR RELIABLE,-ACCURATE "CV /IV, DC & HIGH POWER MEASUREMENT ANALYSIS
    S-1160
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    MULTI-PURPOSE MANUAL PROBE STATION
    100MM, 150MM,200MM MANUAL PROBE SYSTEM DESIGNED FOR RELIABLE AND ACCURATE ANALYTICAL TESTING OF DC, CV-IV, AND HIGH-POWER APPLICATIONS
    SP-150
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    HIGH PRECISION IN-LINE X-Y-Z MICROPOSITIONER
    High-precision micropositioner with inline control knobs, The SP-150 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
    SP-100
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    ULTRA STABLE X-Y-Z 100TPI IN-LINE MICROPOSITIONER
    Ultra-Stable micropositioner with inline control knobs, The SP-100 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
    S-926
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    PRECISISION X-Y-Z 100TPI MICROPOSITIONER
    STABLE 3-AXIS LEANEAR DIRECTION CONTROL MICROPOSITIONER WITH INDEPENDANT CONTROL KNOBS, .
    S-725
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    X-Y-Z ECONOMIC MICROPOSITIONER
    X-Y-Z ECONOMIC MICROPOSITIONER WITH 3 CONTROLS KNOBS, THE S-725 WILL ALLOW EASY LANDING ON PADS AND INTERNAL MICRON LINES .
    U-S
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    PROBE HOLDER WITH SCREW-LOCK PROBE TIP CONNECTION
    Universal series probe tip holder comes in one universal length of 4.75". This holder is made to be bent or cut to length by the customer.
    U-P
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    PROBE HOLDER WITH SPRING-CLIP PROBE TIP CONNECTION
    Universal probe tip holder comes in one length of 4.75". This holder is made to be bent or cut by the customer.
    USCB
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    PROBE HOLDERS/ DELRIN ISOLATED COAX
    Low leakage- Delrin isolated, 10pA coaxial probe tip holder with Screw Lock.
    USTB
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    PROBE HOLDERS/ TEFLON ISOLATED COAX
    Low leakage, Teflon isolated, 1pA coaxial probe tip holder with Screw Lock.
    USGB
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    PROBE HOLDERS/ CERAMIC ISOLATED COAX
    Low leakage, Ceramic isolate, high temperature, coaxial probe tip holder with Screw Lock.
    UPCB
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    PROBE HOLDERS/ DELRIN ISOLATED COAX
    Low leakage, delrin isolated, 10pA probe holder with Spring Clip.
    UPTB
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    PROBE HOLDERS/ TEFLON ISOLATED COAX
    Low leakage, Teflon isolated 1pA coaxial probe tip holder with Spring Clip.
    UPGB
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    PROBE HOLDERS/ CERAMIC ISOLATED COAX
    Low Leakage ceramic isolated, high temperature, coaxial probe holder with Spring Clip.
    TRX-L-60-#
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    PROBE HOLDERS/ TRIAXIAL ISOLATION
    Very low-leakage, isolated 2fA triaxial probe holder with Screw Lock.
    SCA-50
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    HIGH ISOLATED COAX PROBE HOLDERS
    LOW LEAKAGE ISOLATED <10fA COAX PROBE & HOLDER
    SCA-250
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    HIGH ISOLATED KELVIN COAX PROBE & HOLDERS
    DOUBLE TIP AVAILABLE FROM 5µ TO 12.5µ WITH SPACING OF 12.5µ TO 100µ
    SE-T
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    5µ, TUNGSTEN PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-TB
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    25µ TUNGSTEN PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 25µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-TC
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    TUNGSTEN CARBIDE PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE TUNGSTEN CARBIDE CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.
    SE-TG
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    GOLD PLATED TUNGSTEN PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE GOLD PLATED TUNGSTEN CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATION.
    SE-TL
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    TUNGSTEN PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONG LENGTH SHAFT OF 50.1MM, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-TZ
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    Z-SHAPE TUNGSTEN PROBE TIPS
    Z-SHAPE TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-20T
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    3.5µ TUNGSTEN PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-20TB
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    20µ TUNGSTEN PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-20TBL
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    20µ, TUNGSTEN (LONG) PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONGER LENGTH (51mm), THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR LOW PROFILE SETUPS
    SE-20TZ
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    Z-SHAPE TUNGSTEN PROBE TIPS
    Z-SHAPE TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-20BC
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    BERYLLIUM COPPER PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATION.
    SE-20BCB
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    BERYLLIUM COPPER PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 125µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.
    SE-10T
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    1µ TUNGSTEN PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 1µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-10TZ
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    Z- SHAPE TUNGSTEN PROBE TIPS
    Z-SHAPE TEST TIP WITH TIP DIAMETER OF 1µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
    SE-O
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    OSMIUM PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE OSMIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.
    SE-P
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    PALLADIUM PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE PALLADIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER AND LOW LEAKAGE APPLICATIONS.
    SE-S
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    STEEL PROBE TIPS
    STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE STEEL CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.
    SE-SM
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    TUNGSTEN (CAT-WISKER) PROBE TIPS
    Tip with point diameter of 1µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
    SE-SMS
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    TUNGSTEN (CAT-WISKER) PROBE TIPS
    Tip with point diameter of 0.2µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
    SM-10
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    TUNGSTEN (CAT-WISKER) PROBE TIPS
    (Cat-Wisker) Tip with point diameter of 0.2µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
    SM-35
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    TUNGSTEN (CAT-WISKER) PROBE TIPS
    (Cat-Wisker) Tip with point diameter of 0.7µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
    S-1080
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    FULL TEMPERATURE RANGE THERMAL CHUCK CONTROLLER
    THERMAL CHUCK CONTROLLER FOR A VERIETY OF TEMPERATURE PROBING APPLICATIONS
    MT
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    HIGH POWER MICROSCOPE
    HIGH POWER MICROSCOPE WITH 4 OBJECTIVE TURRIT, CAMERA MOUNT, AND FIBER OPTIC ILLUMINATION
    SMZ-171
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    STEREO ZOOM LOW POWERED MICROSCOPE
    STEREOZOOM SCOPE WITH 6.7:1 ZOOM, LED ILLUMINATION, EYEPIECES, TRINOCULAR HEAD, CAMERA PORT WITH LONG WORKING DISTANCE