DC- CV/IV Analytical Probing

300mm Semi-Automatic probe station for reliable and accurate RF/DC/CV/High Power, thermal test measurements.

300mm manual probe station for reliable and accurate RF/DC/CV/High Power , thermal test measurements.

200MM Semi-Automatic Probe Station For Reliable, Accurate RF/DC/CV/& High Power Thermal Test Measurements.

FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS

WL-210-LE PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER THERMAL TEST MEASUREMENTS

Designed for reliable and accurate test of mmW, THz, and impedance tuner applications.

WL-170 PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER TEST MEASUREMENTS

Economical - reliable and accurate test measurements of RF/DC/CV/High Power, MEMS,...devices.

FOR RELIABLE, ACCURATE RF/DC/CV,AND HIGH-POWER ON WAFER TEST MEASUREMENTS

200MM SEMI-AUTOMATIC PROBE STATIONS FOR RELIABLE, ACCURATE RF/DC/CV AND HIGH-POWER TEST MEASUREMENTS

FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS

FOR RELIABLE AND ACCURATE DC, CV/IV, HIGH POWER & RF TEST MEASUREMENTS

FOR RELIABLE,-ACCURATE "CV /IV, DC & HIGH POWER MEASUREMENT ANALYSIS

100MM, 150MM,200MM MANUAL PROBE SYSTEM DESIGNED FOR RELIABLE AND ACCURATE ANALYTICAL TESTING OF DC, CV-IV, AND HIGH-POWER APPLICATIONS

H-150 5mm-100mm Manual Probe System Economically Designed for reliable and Accurate Analytical Testing of DC, CV-IV Applications

CONTROLLED BY SOFTWARE AND/OR BY JOYSTICK - THUMB WHEELS, BUILT-IN MICRO-MOTORS - SPECIFICALLY DESIGNED FOR SUB-MICRON PROBING

High-precision micropositioner with inline control knobs, The SP-150 allows for easy probing on pads as well as internal lines with sub-micron accuracy.

Ultra-Stable micropositioner with inline control knobs, The SP-100 allows for easy probing on pads as well as internal lines with sub-micron accuracy.

STABLE 3-AXIS LEANEAR DIRECTION CONTROL MICROPOSITIONER WITH INDEPENDANT CONTROL KNOBS, .

X-Y-Z ECONOMIC MICROPOSITIONER WITH 3 CONTROLS KNOBS, THE S-725 WILL ALLOW EASY LANDING ON PADS AND INTERNAL MICRON LINES .

ECONOMIC MICROPOSITIONER WITH 3-AXIS CONTROL MOVEMENT, JOYSTICK X-Y MOVEMENT & "Z" KNOB. DESIGNED FOR PAD PROBING

Universal series probe tip holder comes in one universal length of 4.75". This holder is made to be bent or cut to length by the customer.

Universal probe tip holder comes in one length of 4.75". This holder is made to be bent or cut by the customer.

Low leakage- Delrin isolated, 10pA coaxial probe tip holder with Screw Lock.

Low leakage, Teflon isolated, 1pA coaxial probe tip holder with Screw Lock.

Low leakage, Ceramic isolate, high temperature, coaxial probe tip holder with Screw Lock.

Low leakage, delrin isolated, 10pA probe holder with Spring Clip.

Low leakage, Teflon isolated 1pA coaxial probe tip holder with Spring Clip.

Low Leakage ceramic isolated, high temperature, coaxial probe holder with Spring Clip.

Very low-leakage, isolated 2fA triaxial probe holder with Screw Lock.

LOW LEAKAGE ISOLATED <10fA COAX PROBE & HOLDER

DOUBLE TIP AVAILABLE FROM 5µ TO 12.5µ WITH SPACING OF 12.5µ TO 100µ

STRAIGHT TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 25µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE TUNGSTEN CARBIDE CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE GOLD PLATED TUNGSTEN CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATION.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONG LENGTH SHAFT OF 50.1MM, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

Z-SHAPE TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONGER LENGTH (51mm), THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR LOW PROFILE SETUPS

Z-SHAPE TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATION.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 125µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 1µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

Z-SHAPE TEST TIP WITH TIP DIAMETER OF 1µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE OSMIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE PALLADIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER AND LOW LEAKAGE APPLICATIONS.

STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE STEEL CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.

Tip with point diameter of 1µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.

Tip with point diameter of 0.2µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.

(Cat-Wisker) Tip with point diameter of 0.2µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.

(Cat-Wisker) Tip with point diameter of 0.7µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.

CERAMIC ISOLATED <25fA COAX PROBE & HOLDER

THERMAL CHUCK CONTROLLER FOR A VERIETY OF TEMPERATURE PROBING APPLICATIONS

HIGH POWER MICROSCOPE WITH 4 OBJECTIVE TURRIT, CAMERA MOUNT, AND FIBER OPTIC ILLUMINATION

LOW TO HIGH MAG 1X-7X ZOOMING SCOPE WITH LONG WORKING DISTANCE CAMERA PORT AND OPTIONAL EYEPIECES

LOW TO HIGH MAG 1X-12X ZOOMING SCOPE WITH LONG WORKING DISTANCE AND CAMERA PORT

STEREOZOOM SCOPE WITH 6.7:1 ZOOM, LED ILLUMINATION, EYEPIECES, TRINOCULAR HEAD, CAMERA PORT WITH LONG WORKING DISTANCE

  Board Mount Vice Chuck For Holding Individual Chips, Devices, Boards...