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Probe Tips & Holders
WL-210-LE
WL-210-LE MANUAL PROBE SYSTEM WITH LOCAL ENCLOSURE
WL-210-LE PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER THERMAL TEST MEASUREMENTS
WL-210
WL-210 HIGH PRECISION MANUAL RF PROBE STATION
WL-210 PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER TEST MEASUREMENTS
WL-170-THZ
WL-170-THZ STABLE MANUAL RF-mmW PROBE STATION
Designed for reliable and accurate test of mmW, THz, and impedance tuner applications.
WL-1160
WL-1160 MULTI-PURPOSE MANUAL RF PROBE STATION
Economical - reliable and accurate test measurements of RF/DC/CV/High Power, MEMS,...devices.
S-1160
MULTI-PURPOSE MANUAL PROBE STATION
100MM, 150MM,200MM MANUAL PROBE SYSTEM DESIGNED FOR RELIABLE AND ACCURATE ANALYTICAL TESTING OF DC, CV-IV, AND HIGH-POWER APPLICATIONS
S-LAP-90
MANUAL LARGE AREA RF MICROWAVE MICROPOSITIONER
FOR SPECIFIC USE WITH ULTRA-HIGH FREQUENCY RF MEASUREMENTS WITH A MILLIMETER HEAD, ACCOMMODATES FREQUENCY EXTENDERS & TUNERS.
S-M40
IN-LINE MANUAL RF MICROWAVE MICROPOSITIONER
THE S-M40 MICROPOSITIONER IS SPECIFICALLY DESIGNED FOR RF PROBING, IT HAS 25mm TRANSLATION CAPABILITIES IN ALL AXES.
S-M90
MANUAL RF MICROWAVE MICROPOSITIONER
THE S-M90 MICROPOSITIONER IS SPECIFICALLY DESIGNED FOR RF PROBING, INCLUDES INDEPENDANT X-Y-Z-THETA AXES KNOBS-N,S,E,W ORIANTATION.
SP-40
DC-40 GHZ RF PROBE
SERIES OF PROBES FOR RF MICROWAVE APPLICATIONS UP TO 40GHz, GSG, GS, SG
SP-50
DC-50 GHZ RF Probe Head
Series of probes for RF Microwave applications up to 50GHz, GSG, GS, SG or dual configurations (Duel = 2 probes on 1 positioner) Available in different pitch ranging from 25µM to 1250µM
SP-67
DC-67 GHZ RF Probe Head
Series of probes for RF Microwave applications up to 67GHz, GSG, GS, SG or dual configurations (Duel = 2 probes on 1 positioner) Available in different pitch ranging from 25µM to 1250µM
SP-50BT
33 GHZ - 50 GHZ Millimeter Wave Probe Head
A range of probes for millimeter applications from 33GHz to 50GHz, in GSG, GS or SG configurations
SP-75BT
50 GHz-75 GHZ Millimeter Wave Probe Head
A range of probes for millimeter applications from 50 to 75GHz, in GSG, GS or SG configuration
SP-90BT
60 GHz-90 GHZ Millimeter Wave Probe Head
A range of probes for millimeter applications from 60 to 90GHz, in GSG, GS or SG configurations
SP-120BT
75 GHz-110 GHZ Millimeter Wave PROBE
A range of probes for millimeter applications from 75GHz to 110GHz, in GSG, GS or SG configurations
SP-140BT
90 GHz-140 GHZ Millimeter Wave PROBE
A range of probes for millimeter applications from 90 to 140GHz, in GSG, GS or SG configurations
SP-170BT
110 GHz-170 GHZ Millimeter Wave PROBE
A range of probes for millimeter applications from 110 to 170GHz, in GSG, GS or SG configuration
SP-220BT
140 GHz-220 GHZ Millimeter Wave PROBE
A range of probes for millimeter applications from 140 to 220GHz, in GSG, GS or SG configurations
SP-325BT
PROBE 220GHz-325GHz Millimeter Wave Probe
A range of probes for millimeter applications from 220GHz to 325GHz , in GSG, GS or SG configurations
SP-325BT
PROBE 220 GHz-325 GHZ Millimeter Wave PROBE
A range of probes for millimeter applications from 220 to 325GHz, in GSG, GS or SG configurations
SP-500BT
325 GHz - 500 GHZ Millimeter Wave Probe Head
A range of probes for millimeter applications from 323 to 500GHz, in GSG, GS or SG configurations
SP-1100BT
750 GHz-1100 GHZ /1.1 THz Millimeter Wave PROBE
A range of probes for millimeter applications from 750 to 1100GHz, in GSG, GS or SG configurations
S-MCW-RF
MULTI CONTACT WEDGE PROBE DC - 110 GHZ
Customizable multi-signal probe. Choice of DC & RF probes
SP-CS
CALIBRATION SUBSTRATE FOR RF PROBES
Precise and easy to use calibration standard for use with RF probes- VNA- and cabling assemblies.
SP-150
HIGH PRECISION IN-LINE X-Y-Z MICROPOSITIONER
High-precision micropositioner with inline control knobs, The SP-150 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
SP-100
ULTRA STABLE X-Y-Z 100TPI IN-LINE MICROPOSITIONER
Ultra-Stable micropositioner with inline control knobs, The SP-100 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
S-926
PRECISISION X-Y-Z 100TPI MICROPOSITIONER
STABLE 3-AXIS LEANEAR DIRECTION CONTROL MICROPOSITIONER WITH INDEPENDANT CONTROL KNOBS, .
S-725
X-Y-Z ECONOMIC MICROPOSITIONER
X-Y-Z ECONOMIC MICROPOSITIONER WITH 3 CONTROLS KNOBS, THE S-725 WILL ALLOW EASY LANDING ON PADS AND INTERNAL MICRON LINES .
S-750
Economic 3 Axis Micropositioner
ECONOMIC MICROPOSITIONER WITH 3-AXIS CONTROL MOVEMENT, JOYSTICK X-Y MOVEMENT & "Z" KNOB. DESIGNED FOR PAD PROBING
U-S
PROBE HOLDER WITH SCREW-LOCK PROBE TIP CONNECTION
Universal series probe tip holder comes in one universal length of 4.75". This holder is made to be bent or cut to length by the customer.
U-P
PROBE HOLDER WITH SPRING-CLIP PROBE TIP CONNECTION
Universal probe tip holder comes in one length of 4.75". This holder is made to be bent or cut by the customer.
USCB
PROBE HOLDERS/ DELRIN ISOLATED COAX
Low leakage- Delrin isolated, 10pA coaxial probe tip holder with Screw Lock.
USTB
PROBE HOLDERS/ TEFLON ISOLATED COAX
Low leakage, Teflon isolated, 1pA coaxial probe tip holder with Screw Lock.
USGB
PROBE HOLDERS/ CERAMIC ISOLATED COAX
Low leakage, Ceramic isolate, high temperature, coaxial probe tip holder with Screw Lock.
UPCB
PROBE HOLDERS/ DELRIN ISOLATED COAX
Low leakage, delrin isolated, 10pA probe holder with Spring Clip.
UPTB
PROBE HOLDERS/ TEFLON ISOLATED COAX
Low leakage, Teflon isolated 1pA coaxial probe tip holder with Spring Clip.
UPGB
PROBE HOLDERS/ CERAMIC ISOLATED COAX
Low Leakage ceramic isolated, high temperature, coaxial probe holder with Spring Clip.
TRX-L-60-#
PROBE HOLDERS/ TRIAXIAL ISOLATION
Very low-leakage, isolated 2fA triaxial probe holder with Screw Lock.
SCA-50
HIGH ISOLATED COAX PROBE HOLDERS
LOW LEAKAGE ISOLATED <10fA COAX PROBE & HOLDER
SCA-250
HIGH ISOLATED KELVIN COAX PROBE & HOLDERS
DOUBLE TIP AVAILABLE FROM 5µ TO 12.5µ WITH SPACING OF 12.5µ TO 100µ
HVP-CX-3
HIGH VOLTAGE 3KV COAX PROBE HOLDER
High Voltage 3KV coax probe holder with Needle-Vice tip mount and cable
HPV-CX-10
HIGH VOLTAGE 10KV COAX PROBE HOLDER
High Voltage 10KV coax probe holder with Needle-Vice tip mount and cable.
HPV-TX-3
HIGH VOLTAGE 3KV TRIAX PROBE HOLDER
High Voltage 3KV Triax probe holder with Needle-Vice tip mount and cable.
SE-T
5µ, TUNGSTEN PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-TB
25µ TUNGSTEN PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 25µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-TC
TUNGSTEN CARBIDE PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE TUNGSTEN CARBIDE CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.
SE-TG
GOLD PLATED TUNGSTEN PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE GOLD PLATED TUNGSTEN CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATION.
SE-TL
TUNGSTEN PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONG LENGTH SHAFT OF 50.1MM, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-TZ
Z-SHAPE TUNGSTEN PROBE TIPS
Z-SHAPE TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-20T
3.5µ TUNGSTEN PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-20TB
20µ TUNGSTEN PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-20TBL
20µ, TUNGSTEN (LONG) PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 20µ, LONGER LENGTH (51mm), THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR LOW PROFILE SETUPS
SE-20TZ
Z-SHAPE TUNGSTEN PROBE TIPS
Z-SHAPE TEST TIP WITH TIP DIAMETER OF 3.5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-20BC
BERYLLIUM COPPER PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATION.
SE-20BCB
BERYLLIUM COPPER PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 125µ, THE BERYLLIUM COPPER CAN BE BENT AND / OR CUT - EXCELLANT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.
SE-10T
1µ TUNGSTEN PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 1µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-10TZ
Z- SHAPE TUNGSTEN PROBE TIPS
Z-SHAPE TEST TIP WITH TIP DIAMETER OF 1µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
SE-O
OSMIUM PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE OSMIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER APPLICATIONS AND PROBING ON SOFT OR THIN MATERIALS.
SE-P
PALLADIUM PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE PALLADIUM CAN BE BENT AND / OR CUT - EXCELLENT FOR HIGH POWER AND LOW LEAKAGE APPLICATIONS.
SE-S
STEEL PROBE TIPS
STRAIGHT TEST TIP WITH TIP DIAMETER OF 12µ, THE STEEL CAN BE BENT AND / OR CUT - FOR HIGH POWER AND HARD MATERIAL PROBING APPLICATION.
SE-SM
TUNGSTEN (CAT-WISKER) PROBE TIPS
Tip with point diameter of 1µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
SE-SMS
TUNGSTEN (CAT-WISKER) PROBE TIPS
Tip with point diameter of 0.2µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
SM-10
TUNGSTEN (CAT-WISKER) PROBE TIPS
(Cat-Wisker) Tip with point diameter of 0.2µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
SM-35
TUNGSTEN (CAT-WISKER) PROBE TIPS
(Cat-Wisker) Tip with point diameter of 0.7µ. The rigid tungsten body can be bent and or cut, with a small flexible wire for probing delicate features and metal lines.
S-CBP
LOW LEAKAGE CERAMIC BLADE, HIGH TEMP, COAX PROBE
CERAMIC ISOLATED <25fA COAX PROBE & HOLDER
QUADPRO 2
AUTOMATED SHEET RESISTIVITY MEASUREMENT AND MAPPING SYSTEM
AUTOMATED SHEET RESISTIVITY & TCR MEASUREMENT SYSTEM
ΩPro
DIAGNOSTIC MULTI-TEST RESISTIVITY MEASUREMENT SYSTEM
For laboratory, research, and small production test runs.
Pro4
MANUAL SHEET RESISTIVITY MEASUREMENT SYSTEM
FOR RELIABLE RESISTIVITY MEASUREMENTS ON A LARGE VERIETY OF MATERIALS AND SURFACES
SP4
FOUR-POINT PROBE HEAD
4-Point probe head for resistivity measurements - used at ambient temperatures.
HT4
HIGH TEMPERATURE FOUR-POINT PROBE HEAD
HIGH TEMPERATURE CERAMIC 4-POINT PROBE HEAD (TCR MEASUREMENTS)
Applications
DC- CV/IV Analytical Probing
High Power Characterization
Resistivity Testing
RF - Microwave Test Solutions
Thermal Characterization
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Resistivity Test Systems
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