MULTI-PURPOSE MANUAL PROBE STATION
S-1160
Part Number
S-1160
Title
MULTI-PURPOSE MANUAL PROBE STATION
Applications
CV/IV Measurements & Failure Analysis
Manual Analytical Probing
Probe Stations
MEMS Probing
Description
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Documents
S-1160 DATA SHEETLast Updated: 2024-04-04T21:57:51.959ZWL-1160 FACT SHEETLast Updated: 2024-04-04T21:57:51.963ZTechnical Specifications
WAFER SAMPLE SIZE
25MM 75MM 100MM 150MM 200MM
SAMPLE HOLD DOWN
INDEPENDENT CONTROLLED VACUUM-ZONES
CHUCK-STAGE MOVEMENT
MANUAL GEAR-DRIVE STAGE
XY TRAVEL OF THE CHUCK
203MM X 203MM 8\" X 8\"
CHUCK MATERIAL
NICKEL PLATED BRASS (GOLD PLATE OPTIONAL)
RESOLUTION STANDARD
75-MICRON PER DEGREE OF KNOB REVOLUTION
RESOLUTION FINE
1-MICRON AT 250-MICRONS OF KNOB REVOLUTION
CHUCK PLANARITY
LESS-THAN 10 MICRONS
CHUCK PLANARITY ADJUSTMENT
YES
THETA SETTING RANGE
360 DEGREES
THETA ROTATION LOCK
OPTIONAL
PLATEN MATERIAL
STEEL FOR VACUUM OR MAGNETIC MICROPOSITIONER
PLATEN Z ADJUSTMENT
38MM
CONTACT NON CONTACT HANDLE OF THE PLATEN
10MM
PLATEN CONTACT REPEATABILITY
+-1 MICRON"
OPTICAL STAGE DRIVE
MANUAL- PRECISION LEAD SCREW
OPTICAL BRIDGE XY TRAVEL
50MM X 50MM
OPTICAL BRIDGE Z ADJUST
100 MM MANUAL SET-UP
CHUCK ROLL OUT STAGE FOR EASY LOADING
NO
LOCAL ENCLOSURE
NO
OPTION
PROBE-CARD-ADAPTER DARK-BOX THERMAL-CHUCK CAMERA
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