Search by
    WL-170-THZ
    WL-170-THZ STABLE MANUAL RF-mmW PROBE STATION
    DescriptionDocumentsTechnical SpecificationsRelated Products
    WL-170-THZ
    Part Number
    WL-170-THZ
    Title
    WL-170-THZ STABLE MANUAL RF-mmW PROBE STATION
    Applications
    HF & RF Microwave Probing
    CV/IV Measurements & Failure Analysis
    DC To THz Probe Head Selection
    Frequency Extenders and Tuners
    Millimeter Wave Probing
    Description

    WL-170-THZ PROBE STATIONS DESIGNED FOR RELIABLE AND ACCURATE TEST OF mmW, THz, AND INPEDANCE TUNER APPLICATIONS

    Technical Specifications
    WAFER SAMPLE SIZE
    25MM 75MM 100MM 150MM 200MM
    SAMPLE HOLD DOWN
    INDEPENDENT CONTROLLED VACUUM-ZONES
    CHUCK-STAGE MOVEMENT
    MANUAL GEAR-DRIVE STAGE
    XY TRAVEL OF THE CHUCK
    203MM X 203MM 8\" X 8\"
    CHUCK MATERIAL
    NICKEL PLATED BRASS (GOLD PLATE OPTIONAL)
    RESOLUTION STANDARD
    75-MICRON PER DEGREE OF KNOB REVOLUTION
    RESOLUTION FINE
    1-MICRON AT 250-MICRONS OF KNOB REVOLUTION
    CHUCK POSITION
    CHUCK ABOVE THE PLATEN
    CHUCK PLANARITY
    LESS-THAN 10 MICRONS
    CHUCK PLANARITY ADJUSTMENT
    YES
    THETA SETTING RANGE
    360 DEGREES
    THETA ROTATION LOCK
    OPTIONAL
    PLATEN MATERIAL
    STEEL FOR VACUUM OR MAGNETIC MICROPOSITIONER
    PLATEN Z ADJUSTMENT
    38MM WITH LOCK
    PLATEN CONTACT SEPERATE
    10MM
    PLATEN CONTACT REPEATABILITY
    +-1 MICRON
    PLATEN SIZE
    OVER-SIZED FOR USE WITH LARGE AREA POSITIONERS
    OPTICAL STAGE DRIVE
    MANUAL-COARSE-FINE KNOB
    OPTICAL BRIDGE XY TRAVEL
    50MM X 50MM
    OPTICAL BRIDGE Z TRAVEL
    101 MM PNEUMATIC LIFT
    CALIBRATION CHUCK
    YES OPTIONAL 2ND CHUCK
    CHUCK ROLL OUT STAGE
    NOT STANDARD-AVAILABLE ON UPGRADED SYSTEM
    LOCAL ENCLOSURE
    NOT STANDARD - AVAILABLE ON UPGRADED SYSTEM
    OPTION
    DARK-BOX THERMAL-CHUCK CAMERA