WL-210 HIGH PRECISION MANUAL RF PROBE STATION

WL-210
DescriptionDocumentsTechnical SpecificationsRelated Products
WL-210
Part Number
WL-210
Title
WL-210 HIGH PRECISION MANUAL RF PROBE STATION
Applications
DC To THz Probe Head Selection
HF & RF Microwave Probing
Millimeter Wave Probing
Description

WL-210 PROBE STATIONS FOR RELIABLE,-ACCURATE RF/DC/CV,AND HIGH-POWER TEST MEASUREMENTS

Technical Specifications
WAFER SAMPLE SIZE
25MM 75MM 100MM 150MM 200MM
SAMPLE HOLD DOWN
INDEPENDENT CONTROLLED VACUUM-ZONES
CHUCK-STAGE MOVEMENT
PRECISION LEADSCREW – CARRIAGE AND RAILS
XY TRAVEL OF THE CHUCK
203MM X 203MM 8\" X 8\"
CHUCK MATERIAL
NICKEL PLATED BRASS (GOLD PLATE OPTIONAL)
RESOLUTION STANDARD
14 ΜM PER DEGREE OF KNOB ROTATION
RESOLUTION FINE
1.5 ΜM PER DEGREE OF KNOB ROTATION
CHUCK PLANARITY
LESS-THAN 10 MICRONS
CHUCK PLANARITY ADJUSTMENT
YES
CHUCK Z TRAVEL
2.5MM PRECISION PNEUMATIC LIFT
THETA SETTING RANGE
± 11° (22°)
THETA RESOLUTION
0.01MM PER DEGREE OF KNOB ROTATION
THETA STAGE DRIVE
HIGH RESOLUTION MICROMETER
CHUCK ROLL OUT STAGE:
YES PRESENTATION 190MM
PLATEN MATERIAL
STEEL FOR VACUUM OR MAGNETIC MICROPOSITIONER
PLATEN Z ADJUSTMENT
38MM WITH LOCK
PLATEN CONTACT SEPERATE
10MM
PLATEN CONTACT REPEATABILITY
+-1 MICRON
OPTICAL STAGE DRIVE
MANUAL-COARSE-FINE KNOB
OPTICAL BRIDGE XY TRAVEL
50MM X 50MM
OPTICAL BRIDGE Z TRAVEL
101 MM PNEUMATIC LIFT
CALIBRATION CHUCK
YES OPTIONAL 2ND CHUCK
LOCAL ENCLOSURE
NOT STANDARD - AVAILABLE ON UPGRADED SYSTEM
OPTION
PROBE-CARD-ADAPTER DARK-BOX THERMAL-CHUCK CAMERA