Signatone · Applications
Five disciplines. One factory.
Every Signatone probe station starts from the same chassis family — so when your work moves from DC parametric to RF to high power, you don't replace the station, you reconfigure it. Each discipline below shows the equipment we recommend for it.
RF & mm-wave
RF, mm-wave, and THz on-wafer characterization.
up to 110 GHz · 2 & 4 port
Recommended: WaveLink RF & mm-Wave Probe StationsView →
DC / CV-IV
Parametric, low-current, and CV-IV characterization.
~±2 fA (TRX holder + triaxial chuck, shielded)
Recommended: CheckMate Analytical Probe StationsView →
High Power
PowerPro — wafer-level SiC, GaN, and IGBT power device characterization.
up to 3 kV triax / 10 kV coax
Recommended: CheckMate Analytical Probe StationsView →
4-point resistivity
Sheet resistance, resistivity, and 2D / 3D contour mapping.
10 µΩ – 100 MΩ/sq (standard)
Recommended: Resistivity SystemsView →
Thermal characterization
Hot, cold, ambient — integrated thermal probing on the same chassis.
−60 °C → +300 °C (depending on chuck)
Recommended: Thermal ChucksView →
Don't see your application?
We've configured stations for solar, MEMS, silicon photonics, Hall‑effect, and a long tail of custom work. Tell us what you're measuring.