Sheet resistance, resistivity, and 2D / 3D contour mapping.
Buyer profile. Thin-film engineers · materials scientists · solar / display labs
The story
The four-point probe — current forced through the outer tips, voltage measured at the inner two — is the standard for sheet resistance on conductive films. Eliminating contact resistance is the trick that makes the measurement reliable in ohms per square.
Signatone has offered inline four-point probing solutions since 1968. The Pro4 covers manual sheet and bulk resistivity with a standard range of 10 µΩ to 100 MΩ per square under Keithley 2450 / 2600 control. The QuadPro2 automates it: 10 – 300 mm samples, 5 to 14,000 test points, 2D / 3D contour mapping, and dual-configuration testing per ASTM F84-99 with NIST-traceable calibration.
SP4 and HT4 probe heads cover the spacing, load, and tip-material matrix — the selection guide datasheet walks through choosing the right head for your film.
Operating envelope
| Parameter | Value |
|---|---|
| Pro4 range | 10 µΩ – 100 MΩ/sq (standard) |
| QuadPro2 samples | 10 – 300 mm · 5 – 14,000 test points |
| Mapping | 2D / 3D contour · dual-config ASTM F84-99 |
Compatible instruments
Recommended configuration
Spec your application
Tell us what you're measuring — frequency, voltage, current floor, temperature. We'll recommend a configuration.
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