RF, mm-wave, and THz on-wafer characterization.
Buyer profile. RF design engineers · device physicists · 5G/6G research teams
The story
On-wafer RF measurement preserves device characteristics that are erased the moment a die is packaged. To do it well, every centimeter of the probe path — cable, connector, probe tip — needs to be impedance-matched and on-calibration through the full bandwidth.
Signatone's WaveLink probe stations are purpose-built for this: RF to 110 GHz with 2- and 4-port setups, and extender-based mmW configurations from 110 GHz to 1.5 THz. Large-area positioners like the S-LAP-90 carry the frequency extender itself, and local-enclosure variants shield the measurement.
Pair the station with the SP-BT microwave probe series, S-M40 / S-M90 RF micropositioners, and GGB CS-series calibration substrates — all from the same catalog.
Operating envelope
| Parameter | Value |
|---|---|
| RF | up to 110 GHz · 2 & 4 port |
| mmW / THz | 110 GHz – 1.5 THz · 2-port (extender-based) |
| Calibration | GGB CS-series substrates |
Compatible instruments
Recommended configuration
Spec your application
Tell us what you're measuring — frequency, voltage, current floor, temperature. We'll recommend a configuration.
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